Result Details
27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
        DENIZIAK, S.; SITEK, P.; JENIHHIN, M.; STEININGER, A.; SCHÖLZEL, M.; MRÁZEK, V. 27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems. Kliece: Institute of Electrical and Electronics Engineers, 2024. 155 p. ISBN: 979-8-3503-5934-3.
    
                Type
            
        
                conference proceedings
            
        
                Language
            
        
                English
            
        
            Authors
            
        
                DENIZIAK, S.
                
SITEK, P.
JENIHHIN, M.
Steininger Andreas, Prof. Dr.
SCHÖLZEL, M.
Mrázek Vojtěch, Ing., Ph.D., DCSY (FIT)
        SITEK, P.
JENIHHIN, M.
Steininger Andreas, Prof. Dr.
SCHÖLZEL, M.
Mrázek Vojtěch, Ing., Ph.D., DCSY (FIT)
                    Abstract
            
        This proceedings contains reviewed papers accepted for publication and presentation at the 27th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS2024). Since its origins in 1997 DDECS has continued to provide a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of electronic circuits and systems.
                Keywords
            
        electronic circuit, design, test, design method, digital circuit, analog circuit
                URL
            
        
                Published
            
            
                    2024
                    
                
            
                    Pages
                
            
                        155
                
            
                    Conference
                
            
                    International Symposium on Design and Diagnostics of Electronic Circuits and Systems
                
            
                    ISBN
                
            
                    979-8-3503-5934-3
                
            
                    Publisher
                
            
                    Institute of Electrical and Electronics Engineers
                
            
                    Place
                
            
                    Kliece
                
            
                    DOI
                
            
                    BibTeX
                
            @proceedings{BUT188622,
  editor="DENIZIAK, S. and SITEK, P. and JENIHHIN, M. and STEININGER, A. and SCHÖLZEL, M. and MRÁZEK, V.",
  title="27th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
  year="2024",
  pages="155",
  publisher="Institute of Electrical and Electronics Engineers",
  address="Kliece",
  doi="10.1109/DDECS60919.2024",
  isbn="979-8-3503-5934-3",
  url="https://ieeexplore.ieee.org/servlet/opac?punumber=10508803"
}
                
                Projects
            
        
        
            
        
    
    
        Application-specific HW/SW architectures and their applications, BUT, Vnitřní projekty VUT, FIT-S-23-8141, start: 2023-03-01, end: 2026-02-28, running
            
        
                Research groups
            
        
                Evolvable Hardware Research Group (RG EHW)
            
        
                Departments