Result Details
The Formal Approach to the RTL Test Application Problem Using Petri Nets
RŮŽIČKA, R. The Formal Approach to the RTL Test Application Problem Using Petri Nets. Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002. Brno: Faculty of Information Technology BUT, 2002. p. 78-86. ISBN: 80-214-2094-4.
Type
conference paper
Language
English
Authors
Růžička Richard, doc. Ing., Ph.D., MBA, FIT (FIT)
Abstract
An approach to solve the test application problem is presented. On the basis of RT-level digital circuit formal model, properties of circuit elements, which are important for test controller synthesis, are discussed. Algorithm to extract such information from the model of the circuit and algorithm to create a model of test application to the selected circuit element are presented. To evaluate the relevance of given path for diagnostic data and possibility of parallelism, Petri Nets concept is used.
Keywords
Design for Testability, Testability Analysis, Test Application Problem, Petri Nets
Published
2002
Pages
78–86
Proceedings
Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002
Conference
IEEE Design and Diagnostics of Electronic Circuits and Systems 2002
ISBN
80-214-2094-4
Publisher
Faculty of Information Technology BUT
Place
Brno
BibTeX
@inproceedings{BUT10023,
author="Richard {Růžička}",
title="The Formal Approach to the RTL Test Application Problem Using Petri Nets",
booktitle="Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002",
year="2002",
pages="78--86",
publisher="Faculty of Information Technology BUT",
address="Brno",
isbn="80-214-2094-4"
}
Projects
Formal Approaches in Digital Design Diagnostics - Testable Design Verification, GACR, Standardní projekty, GA102/01/1531, start: 2001-01-01, end: 2003-12-31, completed
Research groups
Departments