Publication Details

Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory

ZBOŘIL, F., KOTÁSEK, Z. Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory. In Proceedings of the ECI'98. Herlany, SR: SAV, 1998. p. 75-80. ISBN: 80-88786-94-0.

Czech title

Nestandardní automatické generování testovacích vzoreků neuronovou sítí

Type

conference paper

Language

English

Authors

Kotásek Zdeněk, doc. Ing., CSc.
Zbořil František, doc. Ing., CSc. (DITS)

Keywords

Hopfield neural network, logic circuits, test pattern generation

Abstract

The paper deals with an unusual application of the Hopfield neural network for test pattern generation of combinational logic circuits.

Published

1998

Pages

75–80

Proceedings

Proceedings of the ECI'98

ISBN

80-88786-94-0

Publisher

SAV

Place

Herlany, SR

BibTeX

@inproceedings{BUT54327,
  author="Zdeněk {Kotásek} and František {Zbořil}",
  title="Nonstandard Automatic Test Pattern Generation Based on Neural Network Theory",
  booktitle="Proceedings of the ECI'98",
  year="1998",
  pages="75--80",
  publisher="SAV",
  address="Herlany, SR",
  isbn="80-88786-94-0"
}