Publication Details
Evolvable Hardware System at Extreme Low Temperatures
evolvable hardware, extreme low temperatures, functional recovery
This paper describes circuit evolutionary experiments at extreme low
temperatures, including the test of all system components at this extreme
environment (EE). In addition to hardening-by-process and hardening by-design,
"hardening-by-reconfiguration", when applicable, could be used tomitigate drifts,
degradation, or damage on electronic devices (chips) in EE, by using
re-configurable devices and an adaptive selfreconfiguration of their circuit
topology. Conventional circuit design exploits device characteristics within
a certain temperature/radiation range; when that is exceeded, the circuit
function degrades. On a reconfigurable device, although component parameters
change in EE, a new circuit design, suitable for new parameter values, may be
mapped into the reconfigurable structure to recover the initial circuit function.
This paper demonstrates this technique for circuit evolution and recovery at
liquid nitrogen temperatures (-196.6 °C). In addition, preliminary tests are
performed to assess the survivability limitations of the evolutionary processor
at extreme low temperatures.
@inproceedings{BUT33688,
author="Ricardo {Zebulum} and Adrian {Stoica} and Didier {Keymeulen} and Lukáš {Sekanina}",
title="Evolvable Hardware System at Extreme Low Temperatures",
booktitle="Evolvable Systems: From Biology to Hardware",
year="2005",
series="Lecture Notes in Computer Science",
volume="3637",
pages="37--45",
publisher="Springer Verlag",
address="Berlin",
isbn="978-3-540-28736-0",
url="http://www.fit.vutbr.cz/~sekanina/publ/ices05/lowtemp.pdf"
}