Publication Details

Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space

STRNADEL, J. Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space. In Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems. Prague: Czech Technical University Publishing House, 2006. p. 161-162. ISBN: 1-4244-0184-4.
Czech title
Plánování testu založené na prohledávání stavového prostoru I-schedule pro systémy na čipu vyžadující nízký příkon
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
Keywords

test scheduling, power constraint, test access mechanism, sessionless, test application graph

Abstract

In the paper, novel sessionless approach to test-schedulling is presented. It utilizes so-called STEPs during special random-search based scheduling algorithm. The algorithm explores the state-space of so-called i-schedules whereas an i-schedule is an integer-vector encoded test-schedule represented by n-touple of STEPs. Proposed algorithm tries to link tests to STEPs in such a way there are no resource sharing conflicts in the best-found test schedule and hopefully, test schedule constraints are met maximally at minimal time and TAM values.

Published
2006
Pages
161–162
Proceedings
Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems
ISBN
1-4244-0184-4
Publisher
Czech Technical University Publishing House
Place
Prague
BibTeX 
@inproceedings{BUT22186,
  author="Josef {Strnadel}",
  title="Power-Constrained, Sessionless SOC Test Scheduling Based on Exploration of I-Schedule State-Space",
  booktitle="Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems",
  year="2006",
  pages="161--162",
  publisher="Czech Technical University Publishing House",
  address="Prague",
  isbn="1-4244-0184-4"
}
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