Publication Details
Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires
Kotásek Zdeněk, doc. Ing., CSc.
scan chain, reorganization, reordering, test, vector, bridge
In the paper, we deal with the idea of reducing the number of test vectors needed to verify proper function of circuit and a method for scan chain order optimisation performed after physical layout is presented. It is shown how the method can be used to decrease the number of test vectors.
The principles of the method are based on parasitic capacity extraction, eliminating some bridging faults in the physical layout by scan chain reordering and subsequent reduction of the number of test vectors needed to test the circuit.
The method was verified on circuits from benchmark set, experimental results are provided and discussed. It is expected that the method can be used in mass production of electronic components.
@misc{BUT193916,
author="Pavel {Bartoš} and Zdeněk {Kotásek}",
title="Reduction of Test Vectors Number based on Parasitic Capacity Extraction of Scan Chain Wires",
year="2012",
pages="1--1",
address="Brno",
note="miscellaneous"
}