Publication Details
IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
The IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems provides a forum for exchanging ideas, discussing research results, and presenting practical applications in the areas of design, test, and diagnosis of nanoelectronic circuits and systems. The symposium also offers insight into relevant European R&D collaborative programs, projects, and technology platforms. The DDECS Symposium series has been organised by Central European countries: Czech Republic (1997, 2002, 2006, 2009, 2013), Poland (1998, 2003, 2007), Slovakia (2000, 2004, 2008), Hungary (2001, 2005), and Austria (2010), Germany (2011), and Estonia (2012). DDECS 2014 was held in Warsaw. The Symposium was organized by the Institute of Microelectronics and Optoelectronics (IMiO) of the Warsaw University of Technology and co-sponsored by IMiO and the Test Technology Technical Council (TTTC) of the IEEE Computer Society.
@proceedings{BUT192951,
editor="PLESKACZ, W. and RENOVELL, M. and SEKANINA, L. and BERNARD, S. and KASPROWICZ, D.",
title="IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems",
year="2014",
pages="323",
publisher="IEEE Computer Society",
address="Warsaw",
isbn="978-1-4799-4560-3"
}