Publication Details

Formal Approach to RTL Testability Analysis

KOTÁSEK, Z.; RŮŽIČKA, R.; HLAVIČKA, J. Formal Approach to RTL Testability Analysis. sborník konference IEEE LATW 2000. Rio de Janeiro: unknown, 2000. p. 98-103.

Type

conference paper

Language

English

Authors

Kotásek Zdeněk, doc. Ing., CSc.
Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)
Hlavička Jan

Keywords

RTL testability analysis

Abstract

In the paper a formal approach to the RT level testability analysis ispresented. It is based on the structural analysis of the circuit underdesign and the classification of circuit elements. The elements areclassified on the basis of their possible role during the testapplication. The principles known from the theory of sets andmathematical logic are utilised to define the role of registers duringthe test application. The principles of developing the RT leveltestability analysis algorithms are then presented to identifyregisters for partial scan and parallel paths to apply the test of thecircuit.

Published

2000

Pages

98–103

Proceedings

sborník konference IEEE LATW 2000

Conference

IEEE LATW 2000, Rio de Janeiro, BR

Publisher

unknown

Place

Rio de Janeiro

BibTeX

@inproceedings{BUT191916,
  author="Zdeněk {Kotásek} and Richard {Růžička} and Jan {Hlavička}",
  title="Formal Approach to RTL Testability Analysis",
  booktitle="sborník konference IEEE LATW 2000",
  year="2000",
  pages="98--103",
  publisher="unknown",
  address="Rio de Janeiro"
}