Publication Details

Využití pseudotriviálních testů v diagnostice

STRNADEL, J. Využití pseudotriviálních testů v diagnostice. Sborník prací studentů a doktorandů. Brno: Akademické nakladatelství CERM sro., 2000. s. 249-251. ISBN: 80-7204-155-X.

English title

Utilising pseudo-exhaustive tests in diagnostics

Type

conference paper

Language

Czech

Authors

Strnadel Josef, Ing., Ph.D. (DCSY)

Keywords

exhaustive test, pseudo-exhaustive test, diagnostic cone, VHDL

Abstract

The article discusses exhaustive and pseudo-exhaustive testing in diagnostics and describes the diagnostic cones search method and its implementation, which are the main goals of this research. This method assumes an input combinational logic circuit described structurally in VHDL. The proposed method is implemented as a cross-compiler from VHDL source file to C/C++ target file. The generated C/C++ target file contains functions to be able to create the same combinational logic circuit and to start diagnostic cones search function.

Published

2000

Pages

249–251

Proceedings

Sborník prací studentů a doktorandů

ISBN

80-7204-155-X

Publisher

Akademické nakladatelství CERM sro.

Place

Brno

BibTeX

@inproceedings{BUT191573,
  author="Josef {Strnadel}",
  title="Využití pseudotriviálních testů v diagnostice",
  booktitle="Sborník prací studentů a doktorandů",
  year="2000",
  pages="249--251",
  publisher="Akademické nakladatelství CERM sro.",
  address="Brno",
  isbn="80-7204-155-X"
}