Publication Details
Partial Dynamic Reconfiguration in an FPGA-based Fault-Tolerant System: Simulation-based Evaluation
Lojda Jakub, Ing., Ph.D. (DCSY)
Podivínský Jakub, Ing., Ph.D. (UFYZ)
Kotásek Zdeněk, doc. Ing., CSc.
Fault Tolerant System, FPGA, Partial Reconfiguration, Simulation.
Field Programmable Gate Arrays (FPGAs) are popular not only for their wide range
of usage in embedded systems, however, they are susceptible to radiation effects.
Charged particles cause the so-called Single Event Upsets (SEUs) in their
configuration memory. SEUs can induce failure of the whole system. This problem
is fundamental for space applications where sun radiation is more considerable
than in the Earth. Two main approaches to SEU mitigation technique exist: fault
masking and reparation. The most popular masking method is Triple Modular
Redundancy (TMR). For the faults reparation, FPGA's capability of reconfiguration
is used. It is possible to combine these approaches to obtain improved fault
tolerant system. It is important to assess reliability rate of this system and,
therefore, its estimation by a simulation is the main part of this paper. We
propose evaluation environment which assesses the reliability of a TMR system
with malfunction module reconfiguration depending on faults occurrence frequency
and reconfiguration time necessary for fault reparation.
@inproceedings{BUT155063,
author="Richard {Pánek} and Jakub {Lojda} and Jakub {Podivínský} and Zdeněk {Kotásek}",
title="Partial Dynamic Reconfiguration in an FPGA-based Fault-Tolerant System: Simulation-based Evaluation",
booktitle="Proceedings of IEEE East-West Design & Test Symposium",
year="2018",
pages="129--134",
publisher="IEEE Computer Society",
address="Kazaň",
doi="10.1109/EWDTS.2018.8524728",
isbn="978-1-5386-5710-2",
url="https://www.fit.vut.cz/research/publication/11758/"
}