Publication Details

Modelling VLSI Circuits Using Taylor Series

KOCINA, F.; NEČASOVÁ, G.; VEIGEND, P.; CHALOUPKA, J.; ŠÁTEK, V.; KUNOVSKÝ, J. Modelling VLSI Circuits Using Taylor Series. In 14th International Conference of Numerical Analysis and Applied Mathematics. AIP conference proceedings. Rhodes: American Institute of Physics, 2017. p. 1-4. ISSN: 0094-243X.
Czech title
Modelování VLSI obvodů pomocí metoy Taylorovy řady
Type
conference paper
Language
English
Authors
Kocina Filip, Ing., Ph.D.
Nečasová Gabriela, Ing., Ph.D. (DITS)
Veigend Petr, Ing., Ph.D. (DITS)
Chaloupka Jan, Ing.
Šátek Václav, Ing., Ph.D. (DITS)
Kunovský Jiří, doc. Ing., CSc.
URL
Keywords

Modern Taylor Series Method, Capacitor Substitution Method, ordinary differential equations, electronic circuits

Abstract

The paper introduces the capacitor substitution for CMOS logic gates, i.e. NANDs, NORs and inverters. It reveals the necessity of a very accurate and fast method for solving this problem. Therefore the Modern Taylor Series Method (MTSM) is used which provides an automatic choice of a higher order during the computation and a larger integration step size while keeping desired accuracy.

Published
2017
Pages
1–4
Journal
AIP conference proceedings, no. 1863, ISSN 0094-243X
Proceedings
14th International Conference of Numerical Analysis and Applied Mathematics
Publisher
American Institute of Physics
Place
Rhodes
DOI
10.1063/1.4992513
UT WoS
000410159800340
EID Scopus
2-s2.0-85026660763
BibTeX 
@inproceedings{BUT144388,
  author="Filip {Kocina} and Gabriela {Nečasová} and Petr {Veigend} and Jan {Chaloupka} and Václav {Šátek} and Jiří {Kunovský}",
  title="Modelling VLSI Circuits Using Taylor Series",
  booktitle="14th International Conference of Numerical Analysis and Applied Mathematics",
  year="2017",
  journal="AIP conference proceedings",
  number="1863",
  pages="1--4",
  publisher="American Institute of Physics",
  address="Rhodes",
  doi="10.1063/1.4992513",
  issn="0094-243X",
  url="https://www.scopus.com/inward/record.uri?eid=2-s2.0-85026660763&doi=10.1063%2f1.4992513&partnerID=40&md5=0e83afba5815f966767b37db2d783622"
}
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