Publication Details
Test scheduling for embedded systems
TACG, genetic algorithm, embedded systems
The paper proposes two approaches to test scheduling. The first one utilizes the
concept of TACG (Test Application Conflict Graph). For the testing process the
resource utilization model is defined and used for the TACG construction.
Different conflicts that must be taken into account during test scheduling are
presented. The paper offers a methodology that can be utilized during embedded
test design process, the final goal of which is to reduce the overall test
application time and power consumption during the test application. The second
methodology is based on optimising the test schedule - the test application time,
TAM width and power consumption are taken into account during the process. The
goal of the methodology is a reasonable trade-off between these parameters.
@inproceedings{BUT14193,
author="Zdeněk {Kotásek} and Daniel {Mika} and Josef {Strnadel}",
title="Test scheduling for embedded systems",
booktitle="Proceedings EUROMICRO Symposium on Digital System Design - Architectures, Methods and Tools DSD 2003",
year="2003",
pages="463--467",
publisher="IEEE Computer Society Press",
address="Belek",
isbn="0-7695-2003-0"
}