Publication Details
The Test Controller Model Based on The Timed Automaton
MIKA, D.; KOTÁSEK, Z. The Test Controller Model Based on The Timed Automaton. Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems. Ostrava: 2003. p. 107-114. ISBN: 80-85988-86-0.
Czech title
Model řadiče testu založený na časovaném automatu
Type
conference paper
Language
English
Authors
Mika Daniel, Ing., Ph.D.
Kotásek Zdeněk, doc. Ing., CSc.
Kotásek Zdeněk, doc. Ing., CSc.
Keywords
Register Transfer Level (RTL), Circuit Under Test (CUT), Test Controller Model
Abstract
In the paper the process of the test controller model design andsynthesis on Register Transfer Level (RTL) is described. The principlesof test application to circuit element by the test controller model isdiscussed. The problem of I-path is explained. The formal tool - thetimed automaton - is used as a suitable tool for test controller model.In the end of paper there is a simple example of timed automaton, whichrepresents a model of particular behavior of the test controller.
Published
2003
Pages
107–114
Proceedings
Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems
Conference
MOSIS 2003 - Modelling and Simulation of Systems, Brno, CZ
ISBN
80-85988-86-0
Place
Ostrava
BibTeX
@inproceedings{BUT13967,
author="Daniel {Mika} and Zdeněk {Kotásek}",
title="The Test Controller Model Based on The Timed Automaton",
booktitle="Proceedings of 37th International Conference MOSIS´03 Modelling and Simulation of Systems",
year="2003",
pages="107--114",
address="Ostrava",
isbn="80-85988-86-0"
}