Publication Details

Methodologies of RTL Partial Scan Analysis and Their Comparison

KOTÁSEK, Z.; MIKA, D.; STRNADEL, J. Methodologies of RTL Partial Scan Analysis and Their Comparison. Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems. Poznaň: Publishing House of Poznan University of Technology, 2003. p. 233-238. ISBN: 83-7143-557-6.
Czech title
Sbroník IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
Type
conference paper
Language
English
Authors
Kotásek Zdeněk, doc. Ing., CSc.
Mika Daniel, Ing., Ph.D.
Strnadel Josef, Ing., Ph.D. (DCSY)
Keywords

Register Transfer Level, Feedback Loop, Genetic Algorithm

Abstract

In the paper, two different methodologies for the identification of registers to
be included into the partial scan chain and principles of their implementation
are described briefly. One of them is based on the utilisation of genetic
algorithms, the other one on the identification of feedback loops. An attention
is paid to the computation of time and space complexities of the developed
algorithms. The possibility of the complete state-space exploration (all possible
scan chain configurations) is also discussed. It is derived that algorithms based
on genetic algorithms allow to gain sub-optimal solutions while fulfilling user
requirements. The combination of both methodologies is investigated and the
complexities analysed. Experimental results are described.

Published
2003
Pages
233–238
Proceedings
Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems
ISBN
83-7143-557-6
Publisher
Publishing House of Poznan University of Technology
Place
Poznaň
BibTeX
@inproceedings{BUT13958,
  author="Zdeněk {Kotásek} and Daniel {Mika} and Josef {Strnadel}",
  title="Methodologies of RTL Partial Scan Analysis and Their Comparison",
  booktitle="Proceeding of IEEE Workshop on Design and Diagnostic of Electronic Circuits and Systems",
  year="2003",
  pages="233--238",
  publisher="Publishing House of Poznan University of Technology",
  address="Poznaň",
  isbn="83-7143-557-6"
}
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