Publication Details

Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits

STRNADEL, J. Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits. Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS). Bratislava: Slovak University of Technology in Bratislava, 2016. p. 32-37. ISBN: 978-80-8086-256-5.
Czech title
Modelování a analýza vůči poruchám odolných systémů prostředky UPPAAL SMC: Metoda a výhody
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
Keywords

modeling, analysis, fault tolerant, FT, statistical model checking, SMC, UPPAAL
SMC, reliability analysis, probability distribution, bathtub, fault, transient,
permanent, intermittent, behavior, type, description, signalization, scenario,
tripple modular redundancy, TMR

Abstract

The paper presents a method of modeling and analysis of fault-tolerant (FT)
electronic systems by means of a novel statistical model checking (SMC) approach
available in the UPPAAL SMC tool. The method can be seen as an alternative to
classical analytic approaches based on instruments such as fault-tree or Markov
reliability models of the above-specified systems. Main goal of the paper is to
show that - taking the advantage of SMC - the reliability analysis of systems can
be facilitated even for adverse conditions such as inconstant failure (hazard)
rate of inner system components. In the paper, basic terms and principles related
to modeling and analysis of FT systems are summarized, followed by a short
introduction to the UPPAAL SMC tool, its practical applicability to analysis and
modeling of basic FT systems and evaluation of the results achieved on basis of
the tool.

Published
2016
Pages
32–37
Proceedings
Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)
Conference
19th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems 2016, Košice, SK
ISBN
978-80-8086-256-5
Publisher
Slovak University of Technology in Bratislava
Place
Bratislava
BibTeX 
@inproceedings{BUT130933,
  author="Josef {Strnadel}",
  title="Modeling and Analysis of Fault-Tolerant Systems by Means of UPPAAL SMC: Method and Benefits",
  booktitle="Informal Proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)",
  year="2016",
  pages="32--37",
  publisher="Slovak University of Technology in Bratislava",
  address="Bratislava",
  isbn="978-80-8086-256-5",
  url="https://www.fit.vut.cz/research/publication/11073/"
}
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