Publication Details

The Formal Approach to the RTL Test Application Problem Using Petri Nets

RŮŽIČKA, R. The Formal Approach to the RTL Test Application Problem Using Petri Nets. Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002. Brno: Faculty of Information Technology BUT, 2002. p. 78-86. ISBN: 80-214-2094-4.

Czech title

Formální přístup k problému aplikace testu na obvod na úrovni RT s využitím Petriho sítí

Type

conference paper

Language

English

Authors

Růžička Richard, doc. Ing., Ph.D., MBA (DCSY)

Keywords

Design for Testability, Testability Analysis, Test Application Problem, Petri Nets

Abstract

An approach to solve the test application problem is presented. On the basis of RT-level digital circuit formal model, properties of circuit elements, which are important for test controller synthesis, are discussed. Algorithm to extract such information from the model of the circuit and algorithm to create a model of test application to the selected circuit element are presented. To evaluate the relevance of given path for diagnostic data and possibility of parallelism, Petri Nets concept is used.

Published

2002

Pages

78–86

Proceedings

Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002

ISBN

80-214-2094-4

Publisher

Faculty of Information Technology BUT

Place

Brno

BibTeX

@inproceedings{BUT10023,
  author="Richard {Růžička}",
  title="The Formal Approach to the RTL Test Application Problem Using Petri Nets",
  booktitle="Proceedings of IEEE Design and Diagnostics of Electronic Circuits and Systems 2002",
  year="2002",
  pages="78--86",
  publisher="Faculty of Information Technology BUT",
  address="Brno",
  isbn="80-214-2094-4"
}