Publication Details

Normalized Testability Measures at RT Level: Utilization and Reasons for Creation

STRNADEL, J.; KOTÁSEK, Z. Normalized Testability Measures at RT Level: Utilization and Reasons for Creation. Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems. Vol. I. Ostrava: 2002. p. 297-304. ISBN: 80-85988-71-2.
Czech title
Normalizované Míry Testovatelnosti na RT úrovni popisu: Použití a důvody k vytvoření
Type
conference paper
Language
English
Authors
Strnadel Josef, Ing., Ph.D. (DCSY)
Kotásek Zdeněk, doc. Ing., CSc.
Keywords

Register-transfer level, controllability, observability, testability, testability analysis

Abstract

The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.

Published
2002
Pages
297–304
Proceedings
Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems
Series
Vol. I.
ISBN
80-85988-71-2
Place
Ostrava
BibTeX 
@inproceedings{BUT10010,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Normalized Testability Measures at RT Level: Utilization and Reasons for Creation",
  booktitle="Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems",
  year="2002",
  series="Vol. I.",
  pages="297--304",
  address="Ostrava",
  isbn="80-85988-71-2",
  url="https://www.fit.vut.cz/research/publication/6917/"
}
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