Publication Details

Late Breaking Result: FPGA-Based Emulation and Fault Injection for CNN Inference Accelerators

MASÁR Filip, MRÁZEK Vojtěch and SEKANINA Lukáš. Late Breaking Result: FPGA-Based Emulation and Fault Injection for CNN Inference Accelerators. In: 2025 Design, Automation & Test in Europe Conference & Exhibition (DATE). Lyon: Institute of Electrical and Electronics Engineers, 2025, pp. 1-2. ISBN 978-3-9826741-0-0.
Czech title
Late Breaking Result: Emulace na bázi FPGA a injektování chyb pro akcelerátory CNN inference
Type
conference paper
Language
english
Authors
Masár Filip, Bc. (FIT BUT)
Mrázek Vojtěch, Ing., Ph.D. (DCSY FIT BUT)
Sekanina Lukáš, prof. Ing., Ph.D. (DCSY FIT BUT)
Keywords

Fault injection, hardware accelerator, convolutional neural network inference

Abstract

A new field programmable gate array (FPGA)-based emulation platform is proposed to accelerate fault tolerance analysis of inference accelerators of convolutional neural networks (CNN). For a given CNN model, hardware accelerator architecture, and FT analysis target, an FPGA-based CNN implementation is generated (with the help of the Tengine framework), and fault injection logic is added. In our first case study, we report how the classification accuracy drop depends on the faults injected into multipliers used in Multiply-and-Accumulate Units of NVDLA inference accelerator executing ResNet-18 CNN. The FT analysis emulated on Zynq UltraScale+ SoC is an order of magnitude faster than software emulation.

Published
2025
Pages
1-2
Proceedings
2025 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Conference
Design, Automation and Test in Europe, Lyon, FR
ISBN
978-3-9826741-0-0
Publisher
Institute of Electrical and Electronics Engineers
Place
Lyon, FR
DOI
BibTeX
@INPROCEEDINGS{FITPUB13309,
   author = "Filip Mas\'{a}r and Vojt\v{e}ch Mr\'{a}zek and Luk\'{a}\v{s} Sekanina",
   title = "Late Breaking Result: FPGA-Based Emulation and Fault Injection for CNN Inference Accelerators",
   pages = "1--2",
   booktitle = "2025 Design, Automation \& Test in Europe Conference \& Exhibition (DATE)",
   year = 2025,
   location = "Lyon, FR",
   publisher = "Institute of Electrical and Electronics Engineers",
   ISBN = "978-3-9826741-0-0",
   doi = "10.23919/DATE64628.2025.10992992",
   language = "english",
   url = "https://www.fit.vut.cz/research/publication/13309"
}
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