Evoluční postupy pro zvýšení testovatelnosti číslicových obvodů

With increasing digital circuits complexity and reducing the time-to-value and
time-to-market values, efforts are growing how to at very short time and
certainly test if a produced die does a function it was designed for. Thus,
automated techniques evaluating digital circuit testability measures exist. These
techniques are able to detect difficult-to-test nodes and to suggest the proper
digital circuit structure modification leading to digital circuit testability
enhancement. In the frame of our project, these so called testability analysis
and enhancement techniques are based on evolutionary approaches and they can be
characterized especially by their fast convergence to the searched solution - in
our case to optimal (with respect to designer's claims) digital circuit
testability.